Atomic and Nuclear Analytical Methods

Bild vergrössern

XRF, Mossbauer, NAA and Ion-Beam Spectroscopy

Von Verma, Hem R.

Springer, Berlin, 2007. 220 p. w. 75 figs. 23,5 cm, Gebunden

ISBN: 978-3-540-30277-3

203,29 €

Diesen Artikel liefern wir innerhalb Deutschlands versandkostenfrei. Preis incl. MwSt.

Zum Wunschzettel hinzufügen

This book provides a comprehensive review of nine primary techniques in the field, namely X-Ray Fluorescence (XRF), Particle-Induced X-ray Emission (PIXE), Neutron Activation Analysis (NAA), Nuclear Reaction Analysis (NRA), Proton-Induced Gamma-ray Emission (PIGE), Mossbauer Spectroscopy (MS), Accelerator Mass Spectrometry (AMS), Rutherford Backscattering (RBS) and Elastic Recoil Detection (ERD). All these methods are already well adapted to applications in diverse fields such as medical, environmental studies, archaeology, and materials science. This valuable refrence and overview describes and compares the principles of the methods and the various source and detector types. The clarity of presentation helps to deliver better understanding for both students and researchers.

From the Contents:
1. X-Ray Fluorescence (XRF) and Particle-Induced X-Ray Emission (PIXE)
2. Rutherford Backscattering Spectroscopy (RBS)
3. Elastic Recoil Detection (ERD)
4. Mössbauer Spectroscopy (MS)
5. X-Ray Photoelectron Spectroscopy (XPS)
6. Neutron Activation Analysis (NAA)
7. Nuclear Reaction Analysis (NRA) and Proton-Induced Gamma-Ray Emission (PIGE)
8. Accelerator Mass Spectrometry (AMS).